https://www.fischermeasurementtech.in Latest Products Sat, 11 Apr 2026 08:59:14 +0530 en-us https://www.fischermeasurementtech.in https://www.fischermeasurementtech.in/gold-testing-machine.htm https://www.fischermeasurementtech.in/gold-testing-machine.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/gold-testing-machine-for-assaying-refinery-tunch.htm https://www.fischermeasurementtech.in/gold-testing-machine-for-assaying-refinery-tunch.htm Gold Testing Machine Wed, 12 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/gold-testing-machine-for-hallmarking-centres.htm https://www.fischermeasurementtech.in/gold-testing-machine-for-hallmarking-centres.htm Gold Testing Machine Wed, 12 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/gold-testing-machine-for-jewellery-retail-stores.htm https://www.fischermeasurementtech.in/gold-testing-machine-for-jewellery-retail-stores.htm Gold Testing Machine Wed, 12 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/goldscope-sd-510-510-gold-testing-machine-for-jewellery-retail-stores.htm https://www.fischermeasurementtech.in/goldscope-sd-510-510-gold-testing-machine-for-jewellery-retail-stores.htm Fri, 13 May 2022 00:00:00 +0530 GOLDSCOPE SD 515 is a compact entry-level X-ray fluorescence measuring instrument for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys.   It is used for the non-destructive analysis of jewellery, coins, and precious metals. The machine is ideally used for the analysis of precious metals and their alloys for composition purity and coating thickness. The machine is used for measuring simultaneously up to 24 elements in the range of chlorine (17) to uranium(92). The silicone PIN detector provides good detection sensitivity with high accuracy. The device works with stability and accuracy with a considerable reduction in recalibration thus saving time as well as efforts.   Design An ergonomically engineered user-friendly device in a compact size with longer service life It is light in weight and requires less space for installation. The door of the measurement chamber does not open upwards, but towards the front which allows placing notebook for operation onto the instrument thus saves even more space. The X-ray source and detector assembly is located in the instrument's lower chamber for quick and easy sample positioning. It is also fitted with the integrated video-microscope with zoom and cross-hairs that simplifies sample placement and also allows a precise measuring spot adjustment. The system runs on powerful and user-friendly WinFTMƒ‚‚ software which ensure smooth operations and evaluation of measurements as well as the clear presentation of measurement data.   Features Compact design, efficient, lightweight instrument (appr. 25 kg, 55 lb) and small footprint Designed particularly for analysis of gold alloy at reasonable prices Equipped with a SI-PIN detector that is also suitable for more complex analyses with other elements The machine has been designed for quick and sampling position   Typical fields of applications Jewellery, precious metals and dental alloys Yellow and white gold Platinum and silver Rhodium Alloys and coatings Multi-layer coatings   General Specification Intended use: Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals and their alloys in composition and coating thickness. Element range: Chlorine (17) to Uranium (92) up to 24 elements simultaneously Repeatability: 1 for gold, measurement time 60 sec Design:Bench top unit with towards the front opening hood Measuring direction: Bottom-up   X-Ray Source X-ray tube:Tungsten tube, thermally stabilized High voltage:Three steps: 30 kV, 40 kV, 50 kV Aperture (Collimator): 1 mm (39 mils) Measurement spot:Aperture diameter plus 200m (8 mils),at  measurement distance MD= 0mm   X-Ray Detection X-ray detector:Silicon PIN detector with peltier cooling Resolution (fwhm for Mn±):180 V Measuring distance:25 mm (01in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.   Sample Alignment Sample positioning: Manually Video microscope:High-resolution CCD color camera for optical monitoring of the measurement the location along the primary beam axis,Cross hairs with a calibrated scale (ruler) and spot-indicator, Adjustable LED illumination Zoom factor: Digital 1x, 2x, 3x, 4x   Sample Stage Design: Fixed sample support Usable sample placement area 320 x 350 mm (12.6 x 13.8 in) Max. sample weight:13 kg (29 lb) Max. sample height:115 mm (4.5 in)     Electrical Data Power supply: AC 115 V or AC 230 V 50 / 60 Hz Power consumption: max. 120 W, without evaluation PC Protection class:IP40   Dimensions External dimensions: Width x depth x height [mm]: 404 x 455 x 367 mm, [in]: 16 x 18 x 14.5 Weight:Approx. 25 kg (55 lb)   Environmental Conditions Operating temperature:10°C -40°C / 50°F- 104°F Storage/Transport Temperature: 0 -50°C / 32°F - 122°F Admissible air humidity: 95 %, non-condensing   Evaluation Unit Computer:Windowš-PC Software:Standard: Fischer WinFTM BASIC including PDM Optional: Fischer WinFTM SUPER   Standards CE approval: EN 61010 X-Ray standards: DIN ISO 3497 and ASTM B 568 Approval: Individual acceptance inspection as a fully protected instrument According to the German regulations "Deutsche Rontgenverordnung-RoV". https://www.fischermeasurementtech.in/goldscope-sd-515-sd-515-gold-testing-machine-for-jewellery-retail-stores.htm https://www.fischermeasurementtech.in/goldscope-sd-515-sd-515-gold-testing-machine-for-jewellery-retail-stores.htm Fri, 13 May 2022 00:00:00 +0530 The X-ray fluorescence measuring instruments of the GOLDSCOPE series are optimized for fast, cost-effective and non-destructive analysis of jewelry, coins and precious metals. Furthermore, the instruments are well suited for determining the thickness of gold coatings on sterling silver and rhodium coatings on gold alloys. The GOLDSCOPE series comprises four different instruments to fulfill the specific demands from the fast purchase and sale of gold up to the high-precision analysis of precious metals.   Typical fields of application are the analysis of Jewelry, precious metals Yellow and white gold Platinum and silver Rhodium Alloys and coatings Outstanding accuracy and long-term stability are characteristics of all X-RAY systems from FISCHER. The necessity of recalibration is considerably reduced, saving time and effort. The GOLDSCOPE SD 510 is equipped with a modern silicon PIN detector, which achieves high accuracy and good detection sensitivity. The fundamental parameter method by FISCHER allows for the analysis without calibration.   Design The GOLDSCOPE instruments are designed as user-friendly bench-top instruments. Due to their compact design, the instruments are lightweight and require only a little space. For the smallest footprint, the measurement chamber door of the GOLDSCOPE SD 510 does not open upwards, but towards the front. Thus, you can place a notebook for operation onto the instrument, which saves even more space. For quick and easy sample positioning, the X-ray source and detector assembly is located in the instrument“s lower chamber. The measuring direction is from underneath the sample, which is supported by a transparent window. The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows for a precise measuring spot adjustment. The entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC, using the powerful and user-friendly WinFT software. All GOLDSCOPE instruments fulfill DIN ISO 3497 and ASTM B 568.   Application Recommended area application: of Retail shops, Banks and Gold Lending, Gold Exchange, Personal Use   General Specification Intended use: Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals Repeatability:1%for gold, measurement time 60 sec Design: GOLDSCOPE SD: Bench top unit with towards the front opening hood. Measuring direction: Bottom up   Electrical Data Power supply and consumption: AC 115 or 230 V, 50/60 Hz, max. 120 W without evaluation PC Protection class : IP40   Environmental Conditions Operating temperature :10DegreeC to 45DegreeC/ 50DegreeF to 113DegreeF Storage/Transport temperature: -20DegreeC to 80DegreeC /-4DegreeF to 176DegreeF Relative humidity:95%   Sample Alignment Sample positioning: Manually Video microscope: High-resolution CCD colour camera for optical monitoring of the measurement location along the primary beam axis, Crosshairs with a calibrated scale (ruler) and spot-indicator, Adjustable LED illumination Zoom factor: Digital 1x, 2x, 3x, 4x   Evaluation Unit Computer: Windows-PC Software : WinFTM optimized for GOLDSCOPE Including Gold Setup, Jewelry Setup and Fashion Jewelry Setup   Standards CE approval: EN 61010 X-Ray standards: DIN ISO 3497 and ASTM B 568 Approval: Individual acceptance inspection as a fully protected instrument according to the German regulations Deutsche Rontgenverordnung-RoV   Sample Stage Design: Fixed sample support Max. sample weight [kg/lb]: 13/29 Usable sample placement area : 305 x 490/ [mm/in] 12 x 19.3 Max. sample height [mm/in]: 130/5.1   Dimensions External dimensions: 405 x 588 x 426/ Width x depth x height [mm/in]: 16 x 23 x 17 Weight [kg/lb]: approx. 45/99 X-Ray Source X-ray tube :Tungsten tube, thermally stabilized High voltage, three steps [kV]: 30, 40, 50 Primary filter, Material and thickness : none Aperture (Collimator) :fixed [mm/mils] 1.0/39   X-Ray Detection Detector type :Silicon PIN detector peltier-cooled Resolution fwhm for Mn-ka[eV]:180 Element range: S (16) to U (92) Measuring distance [mm/in]: 0to25/0to1,Distance compensation with patented DCM method for simplified measure- ments at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.   Order Order number :605-684 incl. Gold Setup, Jewelry Setup and Fashion Jewelry Setup Factory Calibration: 605-692 Special GOLDSCOPE product modification and technical consultation on request https://www.fischermeasurementtech.in/goldscope-sd-515-515-gold-testing-machine-for-assaying-refinery-tunch.htm https://www.fischermeasurementtech.in/goldscope-sd-515-515-gold-testing-machine-for-assaying-refinery-tunch.htm Fri, 13 May 2022 00:00:00 +0530 GOLDSCOPE SD 515 is exceptionally designed entry-level X-ray fluorescence measurement instrument used for fast as well as non-destructive analysis along with coating thickness measurement of different metals like gold, silver alloys. The Gold Testing Machine GOLDSCOPE SD 515 is also ideal during non-destructive analysis of coins, jewellery, and precious metals. They are highly useful for the study of precious metals as well as their alloys for composition and coating thickness up to 24 elements in the variety of chlorine (17) to uranium (92).Our range of machine in assaying centers: GOLDSCOPE SD 515  is widely acclaimed for exceptional accuracy and high stability. They are acknowledged for the time-saving property as well as longer service life. Fitted with modern silicon PIN detector, the machines ensure high accuracy and excellent detection sensitivity.FeaturesExcellent accuracy in the analysis as well as coating thickness measurementReduces the recalibration requirements to save time and effortAvailable with PIN detector for high precisionMost advantageous detection sensitivityApplication Areas Alloys and coatings Dental alloys Jewellery Multi layer coatings Platinum and silver Precious metals Rhodium Yellow and white gold General Specification Intended use: Energy dispersive X-ray measuring instrument (EDXRF) to analyze precious metals and their alloys in composition and coating thickness. Element range:Chlorine (17) to Uranium (92) up to 24 elements simultaneously Repeatability: 1 for gold, measurement time 60 sec Design: Bench top unit with towards the front opening hood Measuring direction:Bottom up X-Ray Source X-ray tubeTungsten tube, thermally stabilized High voltage Three steps: 30 kV, 40 kV, 50 kV Aperture (Collimator): 1 mm (39 mils), optional  2 mm (79 mils) Measurement spot:Aperture diameter plus 200 ¼m (8 mils),at measurement distance MD= 0mm X-Ray Detection X-ray detectorSilicon PIN detector with peltier cooling Resolution (fwhm for Mn-K±) 180 eV Measuring distance 25 mm (01 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy anadditional calibration might be necessary. Sample Alignment DesignFixed sample support Usable sample 310 x 320 mm (12.2 x 12.6 in) placement area Max. sample weight 13 kg (29 lb) Max. sample height 90 mm (3.5 in) Electrical Data Power supply AC 115 V or AC 230 V 50 / 60 Hz Power consumptionmax. 120 W, without evaluation PC Protection class IP40 Dimensions External dimensions Width x depth x height [mm]: 403 x 588 x 365 mm, [in]: 15.9 x 23.1 x 14.4 Weight Approx. 45 Kg (99 lb) Environmental Conditions Operating temperature 10°C - 40°C / 50°F- 104°F Storage/Transport temperature 0°C - 50°C / 32°F- 122°F Admissible air humidity95 %, non-condensing Evaluation Unit ComputerWindows-PC Software Standard: Fischer WinFTM BASIC including PDM Optional: Fischer WinFTM SUPER Standards CE approval EN 61010 X-Ray standards DIN ISO 3497 and ASTM B 568 ApprovalFully protected instrument with type approval according to the German regulations "Deutsche Rntgenverordnung-R. https://www.fischermeasurementtech.in/xan-220-xan-220-gold-testing-machine-for-assaying-refinery-tunch.htm https://www.fischermeasurementtech.in/xan-220-xan-220-gold-testing-machine-for-assaying-refinery-tunch.htm Fri, 13 May 2022 00:00:00 +0530 Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients. Environmental Conditions Temperature: Operation 10°C 40°C / 50°F 104°F Temperature Storage/Transport :0°C 50°C / 32 F 122°F Admissible air humidity 95 %, non-condensing Evaluation Unit Computer Windows®-PC Software Standard: Fischer WinFTM® BASIC including PDM® Optional: Fischer WinFTM® SUPER https://www.fischermeasurementtech.in/x-ray-xan-250-gold-testing-machine-for-assaying-refinery-tunch.htm https://www.fischermeasurementtech.in/x-ray-xan-250-gold-testing-machine-for-assaying-refinery-tunch.htm Fri, 13 May 2022 00:00:00 +0530 The high-end measurement system Fischerscope X-Ray XAN 250 was developed specifically for high-precision analysis of precious metals as required for Hallmarking and assay offices. Gold testing machine in assaying centres: XAN250 is engineered using best available techniques. These are high performance X-ray fluorescence measuring instruments widely used for fast and non-destructive material analysis and coating thickness measurement. Compact sized these devices are acclaimed for high performance, longer service life and accurate measurement.Environmental Conditions Temperature Operation:10°C 40°C / 50°F 104°F Temperature Storage/Transport: 0°C 50°C / 32°F 122°F Admissible air humidity:95 %, non-condensing Evaluation Unit Computer:Windows®-PC Software:Standard: Fischer WinFTM® BASIC including PDM® Optional: Fischer WinFTM® SUPER https://www.fischermeasurementtech.in/x-ray-xan-fd-gold-testing-machine-for-assaying-refinery-tunch.htm https://www.fischermeasurementtech.in/x-ray-xan-fd-gold-testing-machine-for-assaying-refinery-tunch.htm Fri, 13 May 2022 00:00:00 +0530 Gold testing machine in hallmarking centres: XAN-FD is a fast and non-destructive coating thickness measurement and material analysis. These are compact in size and widely applicable as an energy-dispersive X-ray fluorescence measuring instrument.Our machines are extensively used for non-destructive thickness measurements and material analysis. These are fitted with electrically changeable apertures and primary filters and modern silicon PIN detector for excellent detection sensitivity and high accuracy. These can be used for coating systems as well as solid and liquid Samples can be analyzed standard-free. Besides, these can easily measure up to 24 elements in a Range from aluminum (13) to uranium (92) simultaneously.Our machines are acclaimed for their long term stability, excellent accuracy, long term stability and ergonomic design. These are very easy to operate and acclaimed for fast calculation and quick data presentation. These are well suited for measuring and analyzing thin coatings, even with very complex compositions or small concentrations. Design We provide user friendly bench-top instruments. These are available in two different range including XAN-FD and XAN 152 and these differ in support stage and the housing size These are ideal to measure range of up to 22 mm. straightened with the integrated video-microscope with crosshairs and up to 184x zoom factor simplifies sample placement, these devices are very easy to install, operate and maintain These are operated through powerful WinFTM® 2 FISCHERSCOPE® X-RAY XAN®-FD, XAN® 152 -FD, XAN® XAN® 152 software, which make these very user friendly and easy to use.   Typical areas of application are Measurement of functional coatings in the electronics and semiconductor industries Analysis of alloys in the jewellery and watch industries Research in universities and in the industries   General Specifications Intended use Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range Aluminum (13) to Uranium (92), up to 24 elements simultaneously Design Bench-top unit with hood opening upwards Measuring direction Bottom-up method    X-ray source X-Ray tube Micro focus tungsten tube with beryllium window High voltage Three steps 10 kV, 30 kV, 50 kV Aperture (collimator) 4x changeable: 0.2 mm, 0.6 mm, 1 mm, 2 mm, others on request Primary filter 3x changeable: Nickel, Aluminum, free, others on request Measurement spot Depending on the measuring distance and on the aperture in use; the actual measurement spot size is shown in the video image. Smallest measurement spot: approx. 0.3 mm Measuring distance 0 20 mm (0 0.8 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications an additional calibration might be necessary.   X-ray detection X-ray detector Silicon PIN detector with peltier cooling and Resolution 180 eV (fwhm at Mn-K±)Sample orientation Video microscope:High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,Crosshairs with a calibrated scale (ruler) and spot-indicator,Adjustable LED illumination of the measurement location Zoom factor:34x ... 184x (optical: 34x46x; digital: 1x, 2x, 3x, 4x) https://www.fischermeasurementtech.in/goldscope-sd-550-sd-550-gold-testing-machine-for-hallmarking-centres.htm https://www.fischermeasurementtech.in/goldscope-sd-550-sd-550-gold-testing-machine-for-hallmarking-centres.htm Fri, 13 May 2022 00:00:00 +0530 The high-end measurement system GOLDSCOPE SD 550‚ was developed specifically for high-precision analysis of precious metals as required for Hallmarking and assay offices. GOLDSCOPE SD 550‚ is engineered using best available techniques. These are high-performance X-ray fluorescence measuring instruments widely used for fast and non-destructive material analysis and coating thickness measurement. Compact sized these devices are acclaimed for high performance, longer service life and accurate measurement.‚ Design These are user-friendly devices acclaimed for compact size and consistent performance. Our devices are acclaimed for their quick and easy sample positioning and consistent performance. These are fitted with the X-ray source and semiconductor detector which are further located in the instrument€š‚¬ƒâ€¹‚Å“s lower chamber. Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensures clear presentation of measurement data on a PC with the help of powerful and user-friendly WinFTM® software. These are designed and developed in accordance with German regulations "Deutsche Rontgenverordnung Typical areas of application arePrecious Metal Analysis such as analysis of Gold, Silver, Platinum and its alloys along with detection of PGM group elements such as Iridium, Ruthenium, Osmium, Rhenium, Tin and Lead.Measurement of functional coatings, starting from a few nanometers Analysis of alloys with highest requirements of accuracy in the jewelry and watch Industries and in metal refineries Research in universities and in the industries General Specification Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range:Aluminum (13) to Uranium (92), up to 24 elements simultaneously Design:Bench-top unit with hood opening upwards opening hood Measuring direction: Bottom-up X-Ray Source X-ray tube: Micro focus tungsten tube with beryllium window High voltage:‚ Three steps 10 kV, 30 kV, 50 kV Aperture (Collimator):4x changeable: €0.2 mm (7.9 mils), €0.6 mm (23.6 mils), €1 mm (39.4 mils) 2 mm (78.7 mils), others on request. Primary filter: 6x changeable: Ni, free, Al 1000 ½ƒ¼m (39.4 mils); Al 500 ½ƒ¼m (19.7 mils); Al 100 ½ƒ¼m (3.9 mils); Mylar® 100 ½ƒ¼m (3.9mils). Measurement spot: Depending on the measuring distance and on the aperture, the actual measurement spot size is shown in the video image.Smallest measurement spot: approx. €0.3 mm (11.8 mils) X-Ray Detection X-ray detector:‚ Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K½ƒ±):‚°ƒ¤ 160 eV Measurement distance: 0 ƒ25 mm (0 ƒ1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications, an additional calibration might be necessary. Sample Alignment Sample positioning: Manually Video microscope:‚ High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis, Crosshairs with a calibrated scale (ruler) and spot-indicator, Adjustable LED illumination. Zoom factor:‚ Digital 1x, 2x, 3x, 4x Electrical Data Power supply:AC 115 V or AC 230 V 50 / 60 Hz Power consumption: Max. 120 W , without evaluation PC Protection class: IP40 https://www.fischermeasurementtech.in/xan-sdd-xdv-sdd-gold-testing-machine-for-hallmarking-centres.htm https://www.fischermeasurementtech.in/xan-sdd-xdv-sdd-gold-testing-machine-for-hallmarking-centres.htm Fri, 13 May 2022 00:00:00 +0530 The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis. Design These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis. These have programmable XY-stage, which make these perfect for auto-mated sample measurements. These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy. These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage. These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement. These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement. These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC.    Typical areas of application are: Analysis of very thin coatings, e.g. gold/palladium coatings of 0.1 ¼m Trace analysis on pc boards according to ROHS and WEEE requirements Gold analysis Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control   General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range: Aluminum Al (13) to Uranium U (92) – up to 24 elements simultaneously Design: Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction: From top to bottom   X-Ray Source X-ray tube Micro focus tungsten tube with beryllium window High voltage Three steps 10 kV, 30 kV, 50 kV Aperture (Collimator): 4x changeable: 0.2 mm (7.9 mils), ˜ 0,6 mm (23.6 mils), 1 mm (39.4 mils),˜ 3 mm (118 mils), others on request Primary filter: 6x changeable (Ni, free, Al 1000 ¼m (39.4 mils), Al 500 ¼m (19.7 mils), Al 100 ¼m (3.9 mils), Mylar® 100 ¼m (3.9 mils) Measurement spot size: Depending on measurement distance and aperture, Measurement spot size‰ˆ aperture size + 10% The actual measurement spot size is shown in the video image. Smallest Measurement spot: approx. 0.25 mm (9.8 mils)   X-Ray Detection X-ray detector : Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K±)‰¤ 140 eV Measurement distance:0 80 mm (0 3.1 in) Distance   compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.   Sample Alignment Video microscope High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,manual focusing and auto-focus, crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED illumination, laser pointer (class 1) to support accurate sample placement. Zoom factor Digital 1x, 2x, 3x, 4x Focusing Auto-focus and manually controlled motor focus.Manual adjustment of the focal plane in a range from 0 to 80 mm.   Sample Stage Design Fast, programmable XY-stage with pop-out function Maximum travel X/Y-axis: 250 mm x 250 mm (9.8 x 9.8 in); Z-axis: 140 mm (5.5 in) Max. travel speed 60 mm/s (0.2 ft/s) Repeatability precision XY unidirectional: 5 ¼m (0.2 mils) max., 2 ¼m (0.08 mils) typ. Usable sample placement area 370 x 320 mm (14.6 x 12.6 in) Max. sample weight5 kg (11 lb), with reduced approach travel precision 20 kg (44 lb) Max. sample height 140 mm (5.5 in)   Electrical Data Power supplyAC 115 V or AC 230 V 50 / 60 Hz Power consumptionMax. 120 W ,without evaluation PC Protection class IP40   Dimensions External dimensionsWidth x depth x height [mm]:660 x 835 x 720 mm, [in]: 26 x 32.9 x 28.3 Interior dimensions Width x depth x height [mm]: measurement chamber  580 x 560 x 145 mm, [in]: 22.8 x 22 x 5.7 Weight Approx. 140 kg (308 lb)   Environmental Conditions Temperature: Operation10°C 40°C / 50 ° 104 °F Temperature:0 °C 50°C / 32 F 122°F Storage/Transport Admissible air humidity: 95 %, non-condensing   Evaluation Unit Computer Windows®-PC Software Standard: Fischer WinFTM® BASIC including PDM®, Optional: Fischer WinFTM® SUPER   Standards CE approval EN 61010 X-Ray standards DIN ISO 3497 and ASTM B 568 Approval Fully protected instrument with type approval according to the German regulations "Deutsche Rontgenverordnung-RoV". https://www.fischermeasurementtech.in/x-ray-xdal-237-gold-testing-machine-for-hallmarking-centres.htm https://www.fischermeasurementtech.in/x-ray-xdal-237-gold-testing-machine-for-hallmarking-centres.htm Fri, 13 May 2022 00:00:00 +0530 Gold testing machine in hallmarking centres: XDAL237 is engineered under the firm direction of experienced quality controllers. These are widely used as X-ray fluorescence measuring instrument with a programmable XY-stage and Z-axis for automated measurements of thin coatings in Gold Hallmarking, Assaying and Manufacturing Centres.These are widely used for non-destructive measurements and analysing very thin coatings. Design These are uniquely designed and developed with high-precision, programmable XY-stage and an electrically. These are user-friendly bench-top instruments acclaimed for sample stage moves into the loading position automatically, when the protective hood is opened. These are compact sized, robust designed and ensure longer stability. Its laser pointer works as a positioning aid and supports the quick alignment of the sample to be measured. These are operated through the powerful and user-friendly WinFTM® software and designed as per German regulations Deutsche Rontgenverordnung-rov". Its entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC through software.   Typical areas of application are Analysis of very thin coatings of 0.1 ¼m (0.004 mils) Measurements of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control Determination of the lead content in solder   General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously Design:Bench-top unit with hood opening upwards XY-stage and Z-axis  electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction: Top down   X-Ray Source X-ray tube Micro focus tungsten tube with beryllium window High voltage Three steps 10 kV, 30 kV, 50 kV Aperture (Collimator):4x changeable: 0.1 mm (3.9 mils), 0.3 mm (11.8 mils),˜ 0.6 mm (23.6 mils) slot 0.5 x 0.15 mm (19.7 x 5.9 mils), others on request Primary filter: 3x changeable (Standard configuration: Nickel, Aluminum, no filter) Measurement spot: Depending on the measuring distance and on the aperture, the actual spot size is shown in the video image. Smallest measurement approx. 0.15 mm (5.9 mils) with aperture 0.1 mm (3.9 mils)   X-Ray Detection X-ray detector Silicon PIN detector with peltier cooling Resolution (fwhm for Mn-K±) 200 eV Measurement distance:0 80 mm (0 3.2 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.   Sample Alignment Video microscope High-resolution CCD color camera for optical monitoring of the measurement location along the primary beam axis,manual focusing and auto-focus, crosshairs with a calibrated scale (ruler) and spot-indicator,adjustable LED illumination, laser pointer (class 1) to support accurate sample placement. Zoom factor Digital 1x, 2x, 3x, 4x   Sample Stage Design Programmable, motor-driven XY-stage Maximum Travel X/Y-axis: 255 x 235 mm (10 x 9 in); Z-axis: 140 mm (5 in) Max. travel speed 80 mm/s (3.2 in/s) Repeatability precision XY ‰0.01 mm (0.4 mils), unidirectional Usable sample placement area Width x depth [mm]: 300 x 350 mm, [in]: 12 x 14 Max. sample weight 5 kg, with reduced approach travel precision 20 kg Max. sample height 140 mm (5.5 in) Electrical Data Power supply AC 115 V or AC 230 V 50 / 60 Hz Power consumption Max. 120 W ,without evaluation PC Protection class IP40   Dimensions External dimensions Width x depth x height [mm]: 570 x 760 x 650 mm, [in]: 22 x 30 x 26 Interior dimensions Width x depth x height [mm] measurement chamber: 460 x 495 x 146 mm, [in]: 18 x 19.5 x 5.7 Weight Approx.:115 kg (52 lb)   Environmental Conditions Temperature: Operation10°C 40°C / 50°F 104 °F Temperature Storage/Transport: 0°C €“50°C / 32°F 122 °F Admissible air humidity 95 %, non-condensing   Evaluation Unit Computer Windows®-PC Software Standard:Fischer WinFTM® BASIC including PDM® Optional: Fischer WinFTM® SUPER   Standards CE approval EN 61010 X-Ray standards DIN ISO 3497 and ASTM B 568 Approval Fully protected instrument with type approval according to the German regulations "Deutsche Rontgenverordnung-RoV https://www.fischermeasurementtech.in/x-ray-xan-220-gold-testing-machine-for-hallmarking-centres.htm https://www.fischermeasurementtech.in/x-ray-xan-220-gold-testing-machine-for-hallmarking-centres.htm Fri, 13 May 2022 00:00:00 +0530 Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients. https://www.fischermeasurementtech.in/coating-thickness-gauges.htm https://www.fischermeasurementtech.in/coating-thickness-gauges.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/probes-coating-thickness-gauges.htm https://www.fischermeasurementtech.in/probes-coating-thickness-gauges.htm Fri, 13 May 2022 00:00:00 +0530 Probes For Coating Thickness Measurements Typical Fields of Applications of Coating Thickness Measurements Measurement of rust protection coating in plastics on steel pipes with the probe FKB10 Measuring of duplex coatings using the probe FDX13H Measurements of anodized coatings with curvature-compensating probe FTD3.3 Automated measurement on piston rods of the chrome coating with the probe V2FGA06H Measurement with the two-pole probe V7FKB4 of zinc powder coating Measurement using the Dual probe FD10 of auto body paint thickness   Various measurement areas Measurement of the coating thickness with the given below material combinations: Diameter from 2 mm (78.7 mils) Areas from 30 mm x 30 mm (1.18 " x 1.18œ)   Various measuring sites Easily reachable Flat and even surfaces High specimen temperatures up to + 80oC (+ 176oF) Humidity ambient Boreholes Grooves and cavities Curved surfaces and on cylinders   Automated or manual measurements Hand-held probes Built-in probes for automated measuring systems   Various coating hardnesses Hard coating materials (metallic coatings like chrome etc.) Softly coated materials (paint, lacquer, textiles etc.)   Various coating hardnesses Epoxy and plastic Iron and steel Non-ferrous metals Steel under Duplex coating systems Various metals   Various coating hardnesses Single probe tip or double probe tips Round or even pole tips Different probe tip sizes Different probe tip materials, e.g. hard metal, jewel, TiN/TiC, PVD, hard plastic https://www.fischermeasurementtech.in/coating-thickness-handheld-gauges.htm https://www.fischermeasurementtech.in/coating-thickness-handheld-gauges.htm Coating Thickness Gauges Wed, 12 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/pocket-coating-thickness-gauges.htm https://www.fischermeasurementtech.in/pocket-coating-thickness-gauges.htm Coating Thickness Gauges Wed, 12 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/pmp-series-pmp10-coating-thickness-handheld-gauge.htm https://www.fischermeasurementtech.in/pmp-series-pmp10-coating-thickness-handheld-gauge.htm Fri, 13 May 2022 00:00:00 +0530 Features of Coating Thickness Handheld Gauge   DUPLEX measuring mode of Handheld Gauge Phascope displays paint on zinc on iron and paint on aluminum DUAL measuring mode for showing total thickness (paint and zinc) on iron or paint on aluminum Wide-ranging evaluation as well as statistics functions Tolerance monitoring and outlier control options Varied languages to choose from Battery and/or constant operation using plug-in charger (included) Storage up to 20,000 readings Data transfer using RS232 interface https://www.fischermeasurementtech.in/dft-meter-mp0-series-pocket-coating-thickness-gauge.htm https://www.fischermeasurementtech.in/dft-meter-mp0-series-pocket-coating-thickness-gauge.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness pocket gauge MP0 is a specially designed measuring instrument to measure coating thickness rapidly and accurately. This coating thickness pocket gauge - MP0 is perfect for instant anywhere use due to its small size, light weight and reliable design. These are crafted to perform operations like menu navigation and have graphic display. Coating thickness pocket gauge unveils the reading of measurement in seconds and displays it directly on the top. This coating thickness pocket gauge - MP0 is customized with different language options thus fulfilling the requirement of different language users.   Models PERMASCOPE MP0: Probe integrated in the measuring instrument for single-handed operation   PERMASCOPE MP0-FP: Probe with cable (80 cm; 31.5 ) permanently connected to the instrument, for measurements on various specimen shapes   Applications Zinc, chromium, copper, paint, varnish and plastic coatings on steel, iron or cast iron (Fe) https://www.fischermeasurementtech.in/portable-mp0-pocket-coating-thickness-gauge.htm https://www.fischermeasurementtech.in/portable-mp0-pocket-coating-thickness-gauge.htm Fri, 13 May 2022 00:00:00 +0530 Adaption to the coating and substrate material in one step using a coated reference part with a coating thickness higher than 200 m (7.87 inches). This kind of calibration supplies only a lower accuracy.General Features Measuring method : Magnetic induction method (ISO 2178, ASTM D7091, Measurement of non-magnetic coatings on magnetic substrates) Probe:Probe tip radius : 2 mm (78 mils); Probe tip material: Hard metal Data memory : Max. 1,000 individual readings; the contents of the memory is retained even without batteries Measuring frequency : Automatic upon placement of the probe; indication of the measurement with a beep visually with a green lit LED Display : Graphic display, in addition to the measurement reading the mean value and the standard deviation or the number of measurement reading can also be displayed.LCD display on the top side of the instrument, e.g., for reading the measurement value for measurement overhead Admissible ambient : 0+40C (+32 ... +104F) temperature range during Operation Weight (incl. batteries):MP0: 137 g (4.8 oz) MP0-FP: 184 g (6.5 oz) Power supply:2 Batteries, LR6,, 1.5 V https://www.fischermeasurementtech.in/tester-mp0r-fp-pocket-coating-thickness-gauge.htm https://www.fischermeasurementtech.in/tester-mp0r-fp-pocket-coating-thickness-gauge.htm Fri, 13 May 2022 00:00:00 +0530 Features Coating Thickness Pocket Gauge with permanently attached cable probe for diverse specimen's geometries Outstanding repeatability precision Acoustical as well as optical signal of a dimension capture Tolerance limits for lower and upper limit values Memory for max. 10.000 readings Measuring mode according to SSPC-PA2 of the "Society for Protective Coatings"   Typical fields of application of Thickness Tester MP0R FP Shipbuilding Protective coatings Building maintenance   Gauge Types PERMASCOPE®MP0R-FP DUALSCOPE® MP0R-FP DUALSCOPE® MP0RH-FP https://www.fischermeasurementtech.in/electroplating-and-electroless-coatings.htm https://www.fischermeasurementtech.in/electroplating-and-electroless-coatings.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/fischerscope-x-ray-xdl-series-xdl-electroplating-and-electroless-coatings.htm https://www.fischermeasurementtech.in/fischerscope-x-ray-xdl-series-xdl-electroplating-and-electroless-coatings.htm Fri, 13 May 2022 00:00:00 +0530 FISCHERSCOPE X-RAY XDL X-ray fluorescence measuring device for manual as well as automated coating thickness measurements on decorative and protective coatings. They are universally applicable energy dispersive X-ray measuring instruments used for non-destructive thickness measurements as well as analysis of thin coatings for the measurements on mass-produced parts as well as printed circuit boards. FISCHERSCOPE X-RAY XDL is designed under the direction of practiced quality controllers following the international industrial standards.    Models   XDL 210: Plane support stage, fixed Z-axis XDL 220: Plane support stage, motor-driven Z-axis XDL 230: Manually operable XY-stage, motor-driven Z-axis XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis   Applications   Measurement of electroplated mass-produced parts Study of thin coatings like decorative chromium-plating Examination of functional coatings in the electronics as well as semiconductor industries Automated measurements such as printed circuit boards Solution study in the electroplating https://www.fischermeasurementtech.in/xdv-sdd-electroplating-and-electroless-coatings.htm https://www.fischermeasurementtech.in/xdv-sdd-electroplating-and-electroless-coatings.htm Fri, 13 May 2022 00:00:00 +0530 The instrument of Electroplating Thickness ensures quick and exact materials analysis with user-friendly features. The array is ideal for the analysis of varied precious metal as well as gold alloys. The collection comes with geometric arrangement of hardware components. X-ray source as well as detector is situated below the measurement chamber and the measurement is conducted from bottom to top for easy & swift positioning of the samples. The range comes in varied versions only differ in terms of detectors, number of apertures, X-ray tubes, and filters.Features X-ray tube with W-anode as well as glass window or micro-focus X-ray tube having W-anode and beryllium window. Maximum operating conditions: 50 kV, 50W Proportional counter tube, Silicon drift detector as X-ray detector or silicon PIN diode Aperture: fixed or 4-x automatically exchangeable,  0.2 mm to  2 mm Primary filter: fixed, 3-x exchangeable or 6-x automatically exchangeable Fixed sample support Video camera for optical observations of the measurement position along the axis of the primary X-ray beam. Crosshairs with calibrated scale (ruler) as well as display of the measurement spot Design-approved, completely protected instrument compliant with the German X-ray ordinance. Applications Gold as well as precious metal study in the Jewellery and watch industries Measurement of thin coatings of few nanometers like Au and Pd on the printed circuit boards as well as electronics components Trace study (e.g. harmful substances in electronic components (ROHS) or tools) Examination of light elements like Al, Si, P with the XAN 250 General materials analysis as well as coating thickness measurement in testing institutions, laboratories and universities https://www.fischermeasurementtech.in/xdv-u-electroplating-and-electroless-coatings.htm https://www.fischermeasurementtech.in/xdv-u-electroplating-and-electroless-coatings.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness gauge for electroplating and electroless coatings XDV-µ or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.Applications Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 μm (0.004 mils) Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control https://www.fischermeasurementtech.in/polychlorinated-biphenyls.htm https://www.fischermeasurementtech.in/polychlorinated-biphenyls.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/pcb-coating-thickness-measurement-gauge.htm https://www.fischermeasurementtech.in/pcb-coating-thickness-measurement-gauge.htm Fri, 13 May 2022 00:00:00 +0530 PCB coating thickness measurement gauge - XULM PCB is engineered under the firm direction of experts. These are specific X-Ray fluorescence measuring instrument widely used for measurements and analyses of coating thicknesses and compositions on printed circuit boards. These are specific robust entry-level instrument, widely recommended by large numbers of clients.Applications Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in) Measurements of functional coatings in the electronics and semiconductor industries Determining of the composition of electroplating baths General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys. Element range: Chlorine (17) to Uranium U (92) ‚¬ up to 24 elements simultaneously. Design: Bench-top unit with housing with a slot on the side Fixed sample support Measuring direction: Bottom up https://www.fischermeasurementtech.in/connector-coating-thickness-measurement-gauges.htm https://www.fischermeasurementtech.in/connector-coating-thickness-measurement-gauges.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/pcb-coating-thickness-measurement-phasoscope.htm https://www.fischermeasurementtech.in/pcb-coating-thickness-measurement-phasoscope.htm Fri, 13 May 2022 00:00:00 +0530 Hand-held instrument for measuring coating thickness on PC Boards and electroplated surfaces. The hand-held PHASCOPE® PMP10 is ideally suited for quality control in the electroplating and printed circuit board (PCB) industries. Because the instrument employs the phase-sensitive eddy current method (ISO 21 968), it allows the measurement of metal coatings on any substrate. A specially designed probe even enables measurements in PCB throughholes.Applications Measuring copper thickness in PCB through-holes, especially on thick PC Boards. Measuring coating thickness of nickel on steel Measuring zinc or copper on steel – despite rough surfaces and complex surface geometries Measuring the thickness of non-ferrous metals on non-ferrous metals, given sufficient difference in conductivity, e.g. copper on brass or bronze Measuring the thickness of non-ferrous metals on insulating substrates, such as copper layers on circuit boards. Sheet metal processing Paint/zinc on iron, e.g. thin EPD coatings Paint on aluminium Paint on steel Brake line tubing Wire (mesh and lattice), e.g. shopping trolleys Instrument features DUPLEX measuring mode: display of paint on zinc on iron or paint on aluminium DUAL measuring mode: display of total thickness (paint and zinc) on iron or paint on aluminium Extensive evaluation and statistics functions Outlier control and tolerance monitoring options Various languages to choose from Battery and/or continuous operation via plug-in charger (included) Storage of up to 20,000 readings Data transfer via RS232 interface https://www.fischermeasurementtech.in/pcb-xdlm-pcb-210-xrf-spectrometer.htm https://www.fischermeasurementtech.in/pcb-xdlm-pcb-210-xrf-spectrometer.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness measurement for PCB using XDLM PCB 210 is a qualitative range of devices available in various technical specifications. These are extensively acknowledged as specific X-ray fluorescence measuring instruments for measurements and analyses of coating thicknesses and compositions on printed circuit boards. These are acclaimed for its longer service life and outstanding accuracy. Applications Measurements on small components and structures on printed circuit boards in sizes up to 610 x 610 mm (24 x 24 in) Measurements of functional coatings in the electronics and semiconductor industries XDLM-PCB 210 and 220: Automated measurements, e.g., in quality control Determining the composition of electroplating baths General Specification Intended use: Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, small structures and alloys. Element range: Chlorine (17) to Uranium U (92)  up to 24 elements simultaneously. Design: Bench-top unit with housing with a slot on the side Measuring direction: Top down https://www.fischermeasurementtech.in/xdlm-237-connector-coating-thickness-measurement-gauge.htm https://www.fischermeasurementtech.in/xdlm-237-connector-coating-thickness-measurement-gauge.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness measurement gauge XDLM237 is engineered from the best available methods as per the national and international industrial standards. The range is available for measuring manual or automated coating thickness and analysis on electronics components, PC-boards and mass-produced parts even on small parts. Our Coating Measurement Gauge is used for the measurement and study of thin coatings.Models XDLM 231: Plane support stage, motor-driven Z-axis XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position mechanically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Measurement of electroplated mass-produced parts Inspection of thin coatings like decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements like on printed circuit boards General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and alloys. Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously. Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction:Top down https://www.fischermeasurementtech.in/xulm-connector-coating-thickness-measurement-gauges.htm https://www.fischermeasurementtech.in/xulm-connector-coating-thickness-measurement-gauges.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.Applications Measurements on small parts like screws, bolts and nuts Measurements on contacts and electronic components Determining of the composition of electroplating baths https://www.fischermeasurementtech.in/wafer-lead-frame-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/wafer-lead-frame-coating-thickness-measurement-system.htm Fri, 14 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/pvd-cvd-coatings.htm https://www.fischermeasurementtech.in/pvd-cvd-coatings.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/xdv-sdd-wafer-lead-frame-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xdv-sdd-wafer-lead-frame-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 The range of Lead Frame Coating is uniquely designed with high-precision, programmable XY-stage as well as an electrically.The user-friendly bench-top instruments are acclaimed for sample stage moves into the loading position automatically in case the protective hood is opened.These are solid and strong range that ensure longer stability. With laser pointer works as a positioning help and support the rapid alignment of the sample to be measured.These are carefully operated through the dominant and user-friendly WinFTM® software designed as per German regulations Deutsche R ntgenverordnung-rov". Its whole operation as well as evaluation of measurements and the clear arrangement of measurement data is performed on a PC through software.Typical areas of application are Study of very thin coatings of 0.1 m (0.004 mils) Measurements of practical coatings in the electronics as well as semiconductor industries Determination of complex multi-coating systems and lead content in solder Automated measurements such as quality control General Specification Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction:Top down https://www.fischermeasurementtech.in/xdv-u-wafer-lead-frame-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xdv-u-wafer-lead-frame-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-µ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.Applications Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils) Measurement of functional coatings in the semiconductor and electronics industries Determination of complex multi-coating systems Automated measurements like quality control General Specification Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures. Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously. Design:Bench-top unit with hood opening upwards and housing with a slot on the side. X/Y- and Z-axis electrically driven and programmable Motor-driven changeable filters Measuring direction:Top down https://www.fischermeasurementtech.in/fischerscope-x-ray-xdal-pvd-cvd-coatings.htm https://www.fischermeasurementtech.in/fischerscope-x-ray-xdal-pvd-cvd-coatings.htm Fri, 13 May 2022 00:00:00 +0530 Design These are uniquely designed and developed with high-precision, programmable XY-stage and an electrically. These are user-friendly bench-top instruments acclaimed for sample stage moves into the loading position automatically, when the protective hood is opened. These are compact sized, robust designed and ensure longer stability. Its laser pointer works as a positioning aid and supports the quick alignment of the sample to be measured. These are operated through the powerful and user-friendly WinFTM® software and designed as per German regulations Deutsche Rntgenverordnung-rov". Its entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC through software. Typical areas of application are Analysis of very thin coatings of 0.1 ¼m (0.004 mils) Measurements of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control Determination of the lead content in solder General Specification Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys Element range:Aluminum Al (13) to Uranium U (92) €“ up to 24 elements simultaneously Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction:Top down https://www.fischermeasurementtech.in/fischerscope-x-ray-xdv-sdd-xdv-sdd-pvd-cvd-coatings.htm https://www.fischermeasurementtech.in/fischerscope-x-ray-xdv-sdd-xdv-sdd-pvd-cvd-coatings.htm Fri, 13 May 2022 00:00:00 +0530 Design These are uniquely designed and developed with high-precision, programmable XY-stage and an electrically. These are user-friendly bench-top instruments acclaimed for sample stage moves into the loading position automatically, when the protective hood is opened. These are compact sized, robust designed and ensure longer stability. Its laser pointer works as a positioning aid and supports the quick alignment of the sample to be measured. These are operated through the powerful and user-friendly WinFTM® software and designed as per German regulations Deutsche Rntgenverordnung-rov". Its entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC through software. Typical areas of application are Analysis of very thin coatings of ‰¤ 0.1 ¼m (0.004 mils) Measurements of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control Determination of the lead content in solder https://www.fischermeasurementtech.in/wire-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/wire-coating-thickness-measurement-system.htm Fri, 14 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/watch-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/watch-coating-thickness-measurement-system.htm Fri, 14 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/coating-thickness-measurement-system.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/xdlm-231-232-237-wire-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xdlm-231-232-237-wire-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Thin Coating Thickness Measurement Instrument for electroplating and electroless coatings is designed under the direction of knowledgeable quality controllers. The range of Thin Coating Thickness is designed for automated or manual coating thickness measurements and examination on PC-boards. They are energy dispersive X-ray fluorescence measuring instruments for the measurement and investigation of thin coatings, even at small concentrations. Models XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position XDLM 231: Plane support stage, motor-driven Z-axis automatically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Measurement of electroplated mass-produced parts Automated measurements, e.g., on printed circuit boards https://www.fischermeasurementtech.in/xdv-u-wire-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xdv-u-wire-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Applications Energy dispersivex-ray fluorescence measuring instrument (EDXRF) to measure thin coatings andcoating systems on very small flat structures Aluminum Al (13) toUranium U (92)  up to 24 elements simultaneously. Bench-top unit withhood opening upwards and housing with a slot on the side. Measuring direction: Top down X-Ray Source/Detection Standard: Micro focustube with tungsten target and beryllium window Three steps: 10 kV, 30kV, 50 kV Primaryfilter:4x changeable: Ni 10m(0.4 mils); free; Al 1000m (40 mils); Al 500m (20 mils) https://www.fischermeasurementtech.in/xul-210-220-240-wire-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xul-210-220-240-wire-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness measurement gauge for connectors – XULM is available in various technical specifications. These are robust entry-level X-ray fluorescence measuring instruments for non-destructive material analysis and coating thickness measurement. Compact sized these devices are extensively acclaimed for their consistent performance, outstanding accuracy and longer service life. These are widely used for the non-destructive coating thickness measurement and material analysis.Applications Measurements on small parts like screws, bolts and nuts Measurements on contacts and electronic components Determining of the composition of electroplating baths https://www.fischermeasurementtech.in/xan-220-watch-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xan-220-watch-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Jewellery Gold testing machine XAN220 is available in a range of technical specifications for speedy and non-destructive study and coating thickness measurement of silver and gold alloys. The array of Fashion Jewellery Testing Machine is optimized X-ray fluorescence measuring instrument with compact size and reliable performance. They are used for the study of precious metals as well as their alloys in composition and coating thickness. They are used for measuring up to 24 elements in the chlorine (17) to uranium (92) range. Our products are widely celebrated for brilliant precision and long term stability. With time saving quality, functional efficiency and effective usage, the range is widely recommended by clients. https://www.fischermeasurementtech.in/xdal-watch-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xdal-watch-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Watches Coating machine XDAL237 is engineered to use as X-ray fluorescence measuring instrument with a modern programmable XY-stage and Z-axis for automated measurements. Our Watches Coating Thickness device is ideal to test the thin coatings in Gold Hallmarking, Manufacturing and Assaying Centres. They are extensively used for non-destructive measurements and analysing very thin coatings.Design Uniquely designed with high-precision, programmable XY-stage and an electrically. User-friendly bench-top instruments for sample stage moves into the loading position automatically, when the protective hood is opened. Compact, robust and highly stable with laser pointer works as a positioning aid and help fast alignment of the sample to be measured. Operated through the powerful WinFTM® software designed as per German regulations Deutsche Rontgenverordnung-rov". Its whole process, evaluation of measurements and clear presentation of measurement data is conducted on a PC through software. Application Areas Study of very thin coatings of 0.1m (0.004 mils) Measurements of functional coatings in the electronics as well as semiconductor industries Automated measurements, e.g., in quality control Study of lead content in solder and complex multi-coating systems General Specification Intended use: Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to find out thin coatings and alloys Element range:Aluminum Al (13) to Uranium U (92)  up to 24 elements simultaneously Design: Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample Measuring direction: Top down https://www.fischermeasurementtech.in/x-ray-xdv-sdd-xdv-sdd-watch-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/x-ray-xdv-sdd-xdv-sdd-watch-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. Gold testing machine in hallmarking centres: XDV-SDD is engineered under the firm direction of expert quality controllers. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.Design These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis. These have programmable XY-stage, which make these perfect for auto-mated sample measurements. These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy. These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage. These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement. These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement. These are operated using the powerful and user-friendly WinFTM® software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. Typical areas of application are Analysis of very thin coatings, e.g. gold/palladium coatings of ≤ 0.1 μm Trace analysis on pc boards according to ROHS and WEEE requirements Gold analysis Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control   https://www.fischermeasurementtech.in/xrf-spectrometer.htm https://www.fischermeasurementtech.in/xrf-spectrometer.htm Fri, 13 May 2022 00:00:00 +0530 The high-end measurement system Fischerscope X-Ray XAN SDD was developed specifically for non destructive, high precision analysis of thin gold and precious metal coatings. These are basically X-ray fluorescence measuring instrument with a programmable XY-stage and Z-Axis for Automated Measurements of very thin coatings and for trace analysis. These are extensively used as an energy-dispersive X-ray fluorescence measuring instrument for the measurement and analysis of very thin coatings or small concentrations in the trace analysis.Design These are universally applicable energy-dispersive X-ray fluorescence measuring instrument widely used for measuring and analyzing very thin coatings or small concentrations in the trace analysis. These have programmable XY-stage, which make these perfect for auto-mated sample measurements. These are featured with electrically changeable apertures and primary filters and modern silicon drift detector to ensure high accuracy, good detection sensitivity, long term stability and outstanding accuracy. These are widely recommended by clients owing to its precise design, robust design, longer service life and effective usage. These are user-friendly bench-top instrument equipped with programmable XY-stage and an electrically driven Z-axis for automatic measurement. These are also fitted with a laser pointer, integrated video-microscope with zoom, protective hood and cross-Hairs simplifies sample placement for perfect measurement. These are operated using the powerful and user-friendly WinFTM software, for entire operation and evaluation of measurements as well as the clear presentation of measurement data is performed on a PC. Typical areas of application are Analysis of very thin coatings, e.g. gold/palladium coatings of  0.1 m Trace analysis on pc boards according to ROHS and WEEE requirements Gold analysis Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control https://www.fischermeasurementtech.in/bath-analysis-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/bath-analysis-coating-thickness-measurement-system.htm Coating Thickness Measurement System Fri, 14 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/xdl-bath-analysis-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xdl-bath-analysis-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness gauge for electroplating and electroless coatings XDL is an X-ray fluorescence measuring instrument for manual or automated coating thickness measurements on protective and decorative coatings. These are extensively acknowledged as a universally applicable energy dispersive X-ray measuring instruments which are widely used for non-destructive thickness measurements and analysis of thin coatings, for measurements on mass-produced parts and printed circuit boards as well as for the solution analysis. These are engineered under the firm direction of experienced quality controllers and following international industrial standard. Models XDL 210: Plane support stage, fixed Z-axis XDL 220: Plane support stage, motor-driven Z-axis XDL 230: Manually operable XY-stage, motor-driven Z-axis XDL 240: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Measurement of electroplated mass-produced parts Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements, e.g., on printed circuit boards Solution analysis in the electroplating https://www.fischermeasurementtech.in/xdlm-bath-analysis-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/xdlm-bath-analysis-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness gauge for electroplating and electroless coatings XDLM is engineered under the firm direction of experienced quality controllers. These are widely acknowledged as X-ray fluorescence measuring instrument for manual or automated coating thickness measurements and analyses on PC-boards. These are universally applicable energy dispersive X-ray fluorescence measuring instruments and ideal for the measurement and analysis of thin coatings, even at small concentrations. Models XDLM 231: Plane support stage, motor-driven Z-axis XDLM 232: Manually operable XY-stage, motor-driven Z-axis XDLM 237: Motor-driven XY-stage that moves into the loading position automatically, when the protective hood is opened. Motor-driven programmable Z-axis Applications Measurement of electroplated mass-produced parts Inspection of thin coatings, e.g., decorative chromium-plating Analysis of functional coatings in the electronics and semiconductor industries Automated measurements, e.g., on printed circuit boards https://www.fischermeasurementtech.in/solder-joint-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/solder-joint-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness gauge for electroplating and electroless coatings XDV-µ or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.Applications Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames Analysis of very thin coatings, e.g., gold/palladium coatings of ≤ 0.1 μm (0.004 mils) Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control https://www.fischermeasurementtech.in/wafer-frame-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/wafer-frame-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Coating thickness gauge for electroplating and electroless coatings XDV-U or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.Applications Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames Analysis of very thin coatings, e.g., gold/palladium coatings of 0.1 ¼m (0.004 mils) Measurement of functional coatings in the electronics and semiconductor industries Determination of complex multi-coating systems Automated measurements, e.g., in quality control https://www.fischermeasurementtech.in/coulometric-method-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/coulometric-method-coating-thickness-measurement-system.htm Coating Thickness Measurement System Fri, 14 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/couloscope-cms-cms2-coulometric-method-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/couloscope-cms-cms2-coulometric-method-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Couloscope CMS2 is widely used to calculate metallic coating over the metallic as well as non metallic substrate. The range of Benchtop Unit & Measurement Unit Couloscope can measure both single and multi-layer coating. It comes with graphical display for a clear view of measurement with predefined measurement applications. The array has selectable measurement units with different display languages options like South American, Asian, and European.Special Feature Assessment of measurement data in table or graphic format Automatic as well as manual measurement switch-off Applications Multi coatings: Cr/Ni/Cu on iron Dual coatings: Sn/Ni on silver Single coatings: Zn on iron https://www.fischermeasurementtech.in/couloscope-step-cms2-coulometric-method-coating-thickness-measurement-system.htm https://www.fischermeasurementtech.in/couloscope-step-cms2-coulometric-method-coating-thickness-measurement-system.htm Fri, 13 May 2022 00:00:00 +0530 Special Feature of Couloscope CMS Step Assessment of measuring data in table or graphic format Automatic and manual measurement switch-off Additional for the STEP Test measurement Determination of the coating thicknesses as well as potential differences using the cursor Adjustable deplating amperage Automatic measurement sequence for conditioning the silver reference electrode (generation of the required AgCl coating) Applications Single as well as multi coatings Couloscope Step Test measurement: 4-nickel-coating system on aluminum, iron, or ABS https://www.fischermeasurementtech.in/micro-hardness-testing-machine.htm https://www.fischermeasurementtech.in/micro-hardness-testing-machine.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/hm-500-light-micro-hardness-testing-machine.htm https://www.fischermeasurementtech.in/hm-500-light-micro-hardness-testing-machine.htm Fri, 13 May 2022 00:00:00 +0530 Our micro hardness testing instrument - picodentor HM500 Light is an instrumented indentation tester/instrument which is user friendly and designed with high precision. It is used to measure nanome chanical properties like indentation modulus, indentation hardness, elastic modulus and creep. It is checked for quality as per the ISO 14577-1 and ASTM E 2546 standards. Furthermore, this picodentor HM500 Light is designed superbly with reduced positioning requirements and fixed configuration.Design The measuring head contains the intender which is generally a diamond pyramid with 136 ° plane angle. It is checked for quality under DIN EN ISO 14577-2 standards. Indenters with a diamond pyramid according to Berkovich or with hard metal spheres are available as well. The controlled touchdown of the measuring head leads to a very small machine compliance. The measurement of the indentation depth is carried out with a resolution in the picometer range. The micro hardness determination is computer controlled, free of any subjective influence, and thus independent of the operator. Features Very simple operation Excellent price/performance ratio: The achieved resolution and accuracy for the load and distance measurement is in the same range as that of instruments with a much higher purchasing price Minimal sample preparation due to large working area and open layout Measurements on dark surfaces without sample preparation For simple specimen's geometries sufficient positioning accuracy of °m Due to its granite design, the device is extremely dimensionally stable, has a very low thermal expansion and is excellently isolated against vibrations. Additional vibration damping through closed measuring chamber and active anti-vibration table Easy operation through the customizable WIN-HCU Software Typical areas of application are Hard material coatings, general Ultra thin DLC coatings Protective coatings on glass Soil-resistant coatings (sol-gel coatings) Coatings of PC hard disks and CDs Very thin paint coatings Ion implanted surfaces Nanocoatings for sensors Medical technology (e.g. Implants) Matrix effects in alloys Biological materials Ceramic material Plasma-applied coating systems https://www.fischermeasurementtech.in/hm-500-micro-hardness-testing-machine.htm https://www.fischermeasurementtech.in/hm-500-micro-hardness-testing-machine.htm Fri, 13 May 2022 00:00:00 +0530 Microhardness testing instrument - picodentor HM500 is checked for quality by our expert professionals as per the DIN EN ISO 14577-1 standards. It works on indentation depth method in which indenter is continuously pressed into the material tested with an increasing test load, and then unloaded. This microhardness testing instrument - picodentor HM500 is widely demanded in different industrial applications. Furthermore, it is extensively used for bulk material and coatings thinner than 1 ¼m (0.04 mils).Design High resolutions for load ( 1 ¼N) and distance (40 pm); PICONDENTOR can be used for a broad range of applications Motorized z-axis and fully automated surface detection for higher productivity Enhanced high resolution optical system with auto focus and multiple objective turret Custom granite structure for enhanced frame stiffness and low noise floor Minimal sample preparation due to large working area and open layout Measurement of dark surfaces without sample pretreatment Measure on the smallest structures and cross-sections with high precision programmable X/Y table with a repeatability of  0,5 ¼m Vickers, Berkovich, spherical and custom indentors are available Additional vibration damping through closed measuring chamber and active anti-vibration table Easy operation through the customizable WIN-HCU® Software Typical areas of application are Hard material coatings, general Ultra thin DLC coatings Protective coatings on glass Soil-resistant coatings (sol-gel coatings) Coatings of PC hard disks and CDs Very thin paint coatings Ion implanted surfaces Nanocoatings for sensors Medical technology (e.g. Implants) Matrix effects in alloys Biological materials Ceramic materials Hardness determination on cross-sectioned specimens Plasma-applied coating systems https://www.fischermeasurementtech.in/hm-2000-s-micro-hardness-testing-machine.htm https://www.fischermeasurementtech.in/hm-2000-s-micro-hardness-testing-machine.htm Fri, 13 May 2022 00:00:00 +0530 Fischerscope HM2000 S is a modern Microhardness Testing Machine or nanoindentation gauging instrument used for finding the marten€™s hardness HM, particular elastic quantities, the indentation hardness, the indentation modulus as well as supplementary material factors. This fischerscope Microhardness Testing device HM2000 S is tested according to ISO 14577-1 as well as ASTM E 2546 standards. In addition, it also measures the factors in nanometer and micro range.Design Available with a measuring head HT2000 that contains the test load generating unit, the position measurement unit and the indenter that is ideal for measuring indentation depth and whole electronic system. HM2000 S can be upgraded with a programmable positioning aid. Features Minimum requirements on sample preparation In-situ zero point determination while measuring Measurement of dark surfaces with no sample pretreatment Optional: additional stone plate along with silicon damper pads to decrease influence of vibrations Easy operations through the WIN-HCU ® Software Outstanding measuring head HT2000 temperature stability, the creep behavior of materials is determined accurately with measuring times up to numerous hours Ample load and depth variety Ideal for a number of applications like ceramic diamond-like carbon coatings, polymeric automotive clear coats, etc. High end designs for all environments Majority of samples is measured quickly without the need of preparation of special samples Exceptional thermal stability for study of rate-dependent polymers material properties Optional: Stone plate with silicon damper pads to decrease influence of vibrations Indentation: Berkovich, spherical indentors or Vickers are provided Dark surfaces measurement in the lack of sample pre-treatment Convenient operations with customizable WIN-HCU Software Typical areas of application are Paint, synthetic coatings (PVD, CVD) or hard material Materials used in medical technology applications Plasma-applied coating systems Electroplated coatings (decorative, functional) Electronic components https://www.fischermeasurementtech.in/hm-2000-micro-hardness-testing-machine.htm https://www.fischermeasurementtech.in/hm-2000-micro-hardness-testing-machine.htm Fri, 13 May 2022 00:00:00 +0530 Martens hardness testing: fischerscope HM2000 is used for for bulk material and coatings thicker than 1 m (0.04 mils). It is basically automated nanoindentation measuring system with measuring head HT2000. This martens hardness testing: fischerscope HM2000 is designed precisely for instrumented indentation test method and checked as per ISO 14577 standards. Moreover, it is ideally suitable for quality assurance, measurements in development, incoming inspection and process control. Design The measuring head of Fischerscope HM2000 contains the test load generating unit, the indenter and the position measurement unit. It modular design allows future upgradation. Features Ample load and depth range; can be used for a broad range of applications from polymeric automotive clear coats to cermaic diamond-like carbon coatings Motorized z-axis and fully automated surface detection for higher productivity Enhanced high resolution optical system with autofocus and multiple objective turret Custom granite structure for enhanced frame stiffness and low noise floor Measure on smallest structures, cross-sections with high precision programable X/Y-table Minimal sample preparation due to large working area and open layou Measurement of dark surfaces without sample pretreatment Vickers, Berkovich or spherical indentors are available Optional: active damping table to reduce influence of vibrations Easy operation through the customizable WIN-HCU Software Typical areas of application are Paint, synthetic or hard material coatings (PVD, CVD) Electroplated coatings (decorative, functional) Materials used specifically in medical technology applications Electronic components, bond wires, etc Plasma-applied coating systems https://www.fischermeasurementtech.in/material-testing-machine.htm https://www.fischermeasurementtech.in/material-testing-machine.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/smp350-material-testing-machine.htm https://www.fischermeasurementtech.in/smp350-material-testing-machine.htm Sat, 04 Jan 2025 00:00:00 +0530 Our Electrical Conductivity Measurement instrument - sigmascope SMP350 is designed with utmost precision to measure the electrical conductivity of metallic conductor accurately and precisely. Our Electrical Conductivity Sigmascope SMP350 is also used for assessing hardness and strength of various heat treated materials. Electrical conductivity is a basic material property which gives information about metal's ability for conducting electrical current.Features Rapid and easy on-the-spot conductivity calculation of non-ferromagnetic metals as per DIN EN 2004-1 and ASTM E 1004 Windows CE operating system High-resolution touch screen with virtual keypad Conductivity probes Different measurement frequencies from 15 kHz up to 1 MHz Automatic temperature and automatic curvature compensation Certified traceable calibration standards (MS/m, IACS) Typical areas of application are Airplanes Complete measurement of electrical conductivity throughout the production process of aluminum copper, etc Mints Testing of electrical conductivity before anodizing aluminum Thermal sprayed coatings of non-ferromagnetic metals, e.g. Cu Technical data Measurements pursuant to DIN EN 2004-1 and ASTM E 1004 Measurement frequencies from 15 kHz to 1 MHz, as per the probe Measurement range from 0.5 to 65 MS/m or 1 - 112% IACS Measurement accuracy at ambient temperature: +0.5% of reading Smallest diameter measurement without visible influence on the reading: 13 mm Operating temperature: 0-40 oC Lift-off compensation to 500m Connector for electrical conductivity probe, without or with integrated temperature sensor Connector for optional temperature sensor TF100A USB communication Printer port Power supply via mains electricity or battery https://www.fischermeasurementtech.in/ultrasonic-thickness-gauges.htm https://www.fischermeasurementtech.in/ultrasonic-thickness-gauges.htm Thu, 13 Jan 2022 00:00:00 +0530 https://www.fischermeasurementtech.in/fischerscope-gold-purity-analyzer.htm https://www.fischermeasurementtech.in/fischerscope-gold-purity-analyzer.htm Fri, 13 May 2022 00:00:00 +0530 Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients.Design These are user-friendly bench-top instruments available in various housing size and support stage. These are extensively recommended by clients owing to its quick and easy sample positioning. These are available in different range including XAN 220 and XAN 222, which are fitted with small parts and for quick and easy sample positioning. The X-ray source and semiconductor detector assembly is located in the instrument€˜s lower chamber. These are straightened with the integrated video microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment. These are operated through the powerful and user-friendly WinFTM® software. The FISCHERSCOPE X-RAY XAN 220 is designed as per DIN ISO 3497 and XAN 222 fulfill ASTM B 568 standard.  Typical fields of applications Jewellery, precious metals and dental alloys Yellow and white gold Platinum and silver Rhodium Alloys and coatings Multi layer coatings