XUV 773 Wafer & Lead Frame Coating Thickness Measurement System

XUV 773 Wafer & Lead Frame Coating Thickness Measurement System
Business Type Manufacturer, Exporter, Supplier, Retailer, Wholesaler, Importer
Aperture 4x Changeable
Brand Fischer
Power Supply AC 115 V or AC 230 V 50 / 60 HzAC 115 V or AC 230 V 50 / 60 Hz
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Preferred Buyer From

Location Anywhere in India

Product Details

Protection Class
IP40
Power Consumption
Max. 120 W
Dimension
660 x 835 x 720 mm
Design
Bench-top Unit with Hood Opening
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Wafer coating thickness instrument is one of the most favored device of the market due to accurate designs and exceptional accuracy. Our range of Wafer Coating Thickness is high in performance with modern vacuum chamber for non-destructive coating thickness measurements and material examination. Designed as per international industrial standards, our offered devices are used for non-destructive study of thin coatings, light and traces elements. Up to 24 elements of sodium (11) to uranium (92) range can be easily determined at the same time. Ergonomically designed, they are used in vacuum, ambient air or using helium purge (optional).

Applications

  • Examination of very thin coatings of  0.1m (0.004 mils)
  • Measurements of functional coatings in the semiconductor as well as electronics industries
  • Study of complex multi-coating systems and lead content in solder
  • Automated measurements

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