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Wafer Frame Coating Thickness Measurement System

Wafer Frame Coating Thickness Measurement System
Business Type Manufacturer, Exporter, Supplier, Retailer, Wholesaler, Importer
Aperture 4x Changeable
Brand Fischer
Power Supply AC 115 V or AC 230 V 50 / 60 HzAC 115 V or AC 230 V 50 / 60 Hz
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Preferred Buyer From

Location Anywhere in India

Product Details

Protection Class
IP40
Power Consumption
Max. 120 W
Dimension
660 x 835 x 720 mm
Design
Bench-top Unit with Hood Opening

Coating thickness gauge for electroplating and electroless coatings XDV-U or X-Ray Fluorescence Tester is available in various technical specifications. These are widely used for non-destructive analyses and measurements of coating thickness on very small components and structures, even with complex coating systems.

Applications

  • Measurements on very small flat components and structures such as printed circuit boards, contacts or lead frames
  • Analysis of very thin coatings, e.g., gold/palladium coatings of 0.1 ¼m (0.004 mils)
  • Measurement of functional coatings in the electronics and semiconductor industries
  • Determination of complex multi-coating systems
  • Automated measurements, e.g., in quality control

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