Hinjewadi, Pune, Maharashtra
- GST NO. : 27AAACF9487H1Z6
Twitter| Business Type | Manufacturer, Exporter, Supplier, Retailer, Wholesaler, Importer |
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Preferred Buyer From
| Location | Anywhere in India |
Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.
These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.
These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients.
Details
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Application |
Analysis of
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Design |
Fixed Sample Support For quick and easy sample positioning, the X-ray source and semiconductor detector assembly is located in the instruments lower chamber. The measuring direction is from underneath the sample, which is supported by a transparent window. The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment. |
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General Specification |
Intended use Energy dispersive X-ray measuring instrument (EDXRF) to analyze Gold, precious metals and their alloys in composition and coating thickness. Element range Chlorine (17) to Uranium (92) up to 24 elements simultaneously Repeatability 0.5 for gold Measurement time 60 sec Design Bench top unit with upwards opening hood Measuring direction Bottom up |
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X-Ray Source |
X-ray tube Micro-focus tungsten tube with beryllium window Aperture (Collimator) 1 mm (39 mils), optional 2 mm (79 mils) or 0.6 mm (23.6 mils) Measurement spot Aperture diameter plus 200 m (8 mils), at measurement distance MD = 0 mm |
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X-Ray Detection |
X-ray detector Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K±) 160 eV Measuring distance 0 25 mm (0 1 in) Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary |
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Dimensions |
External dimensions Width x depth x height 403 x 588 x 365 mm (16 x 23.2 x 14.4 in) Weight Approx. 45 kg (99 lb) |
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