X-RAY XAN 220 Gold Testing Machine For Hallmarking Centres

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Location Anywhere in India

Gold testing machine in assaying centres: XAN220 is available in various technical specifications these are widely used for fast and non-destructive analysis and coating thickness measurement of gold and silver alloys. These are optimized X-ray fluorescence measuring instruments, acclaimed for compact size and consistent performance.

These are widely used for the analysis of precious metals and their alloys in composition and coating thickness and used for the measurement of up to 24 elements in the range of chlorine (17) to uranium (92). Our products are extensively acclaimed for its excellent accuracy and long term stability.

These are admired for high functional efficiency, time saving quality and effective usage. Owing to its good detection sensitivity and high accuracy, these are widely recommended by large numbers of clients.

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Analysis of

  • Jewellery, precious metals and dental alloys Yellow and white gold
  • Used in Gold Manufacturing, Assaying and Refinery.
  • Platinum and silver
  • Rhodium
  • Alloys and coatings
  • Multi layer coatings


Fixed Sample Support

For quick and easy sample positioning, the X-ray source and semiconductor detector assembly is located in the instruments lower chamber. The measuring direction is from underneath the sample, which is supported by a transparent window. The integrated video-microscope with zoom and crosshairs simplifies sample placement and allows precise measuring spot adjustment.

General Specification

Intended use

Energy dispersive X-ray measuring instrument (EDXRF) to analyze Gold, precious metals and their alloys in composition and coating thickness.

Element range

Chlorine (17) to Uranium (92) up to 24 elements simultaneously


0.5 for gold

Measurement time

60 sec


Bench top unit with upwards opening hood

Measuring direction

Bottom up

X-Ray Source

X-ray tube

Micro-focus tungsten tube with beryllium window

Aperture (Collimator)

1 mm (39 mils), optional 2 mm (79 mils) or 0.6 mm (23.6 mils)

Measurement spot

Aperture diameter plus 200 m (8 mils), at measurement distance MD = 0 mm



X-Ray Detection

X-ray detector

Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K±) 160 eV

Measuring distance

0 25 mm (0 1 in)

Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary


External dimensions

Width x depth x height 403 x 588 x 365 mm (16 x 23.2 x 14.4 in)


Approx. 45 kg (99 lb)

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