Hinjewadi, Pune, Maharashtra
- GST NO. : 27AAACF9487H1Z6
XDV-U Wafer & Lead Frame Coating Thickness Measurement System
| Business Type | Manufacturer, Exporter, Supplier, Retailer, Wholesaler, Importer |
| Dimension | 403 x 588 x 444 mm |
| Testing Methodology | Radiographic Testing |
| Brand | Fischer |
| Click to view more | |
Preferred Buyer From
| Location | Anywhere in India |
Product Details
Service Type
Thickness Measurement
Value Data Report on
Microstructure
Application
Mechanical Engineering
Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-µ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.
Applications
- Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames
- Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils)
- Measurement of functional coatings in the semiconductor and electronics industries
- Determination of complex multi-coating systems
- Automated measurements like quality control
General Specification
- Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures.
- Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously.
- Design:Bench-top unit with hood opening upwards and housing with a slot on the side.
- X/Y- and Z-axis electrically driven and programmable
- Motor-driven changeable filters
- Measuring direction:Top down
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