XDV-U Wafer & Lead Frame Coating Thickness Measurement System

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Business Type	Manufacturer, Exporter, Supplier, Retailer, Importer
Dimension	403 x 588 x 444 mm
Testing Methodology	Radiographic Testing
Brand	Fischer
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Preferred Buyer From

Location

Anywhere in India

Product Details

Service Type

Thickness Measurement

Value Data Report on

Microstructure

Application

Mechanical Engineering

Lead Frame Coating Thickness Measurement gauge for electroplating as well as electroless coatings X-Ray or XDV-Âµ Fluorescence Tester is accessible in diverse technical specifications. The range of o Lead Frame Coating is used for non-destructive analyses as well as measurements of coating thickness on very tiny components and structures with complex coating systems.

Applications

Measurements on very tiny flat components as well as structures like contacts, printed circuit boards, or lead frames
Study of very thin coatings like gold/palladium coatings of 0.1m (0.004 mils)
Measurement of functional coatings in the semiconductor and electronics industries
Determination of complex multi-coating systems
Automated measurements like quality control

General Specification

Intended use:Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to measure thin coatings and coating systems on very small flat structures.
Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously.
Design:Bench-top unit with hood opening upwards and housing with a slot on the side.
X/Y- and Z-axis electrically driven and programmable
Motor-driven changeable filters
Measuring direction:Top down

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