XDV SDD Wafer & Lead Frame Coating Thickness Measurement System

The range of Lead Frame Coating is uniquely designed with high-precision, programmable XY-stage as well as an electrically.

The user-friendly bench-top instruments are acclaimed for sample stage moves into the loading position automatically in case the protective hood is opened.

These are solid and strong range that ensure longer stability. With laser pointer works as a positioning help and support the rapid alignment of the sample to be measured.

These are carefully operated through the dominant and user-friendly WinFTM® software designed as per German regulations Deutsche R ntgenverordnung-rov". Its whole operation as well as evaluation of measurements and the clear arrangement of measurement data is performed on a PC through software.

Typical areas of application are

• Study of very thin coatings of 0.1 m (0.004 mils)
• Measurements of practical coatings in the electronics as well as semiconductor industries
• Determination of complex multi-coating systems and lead content in solder
• Automated measurements such as quality control

General Specification

• Intended use:Energy dispersive X-ray fluorescence measuring instrument (EDXRF) to determine thin coatings and alloys
• Element range:Aluminum Al (13) to Uranium U (92) - up to 24 elements simultaneously
• Design:Bench-top unit with hood opening upwards XY-stage and Z-axis electrically driven and programmable,Motor-driven changeable apertures and filters Video camera and laser pointer (class 1) for orienting the sample
• Measuring direction:Top down