X-RAY XAN 250 Gold Testing Machine For Assaying Refinery & Tunch

• Gold Purity Testing
• Gold Coating Thickness
• Gold analysis in manufacturing, refinery and Hallmarking centres.
• Measurement of functional coatings, starting from a few nanometers, in the electronics and semiconductor industries
• Trace analysis for consumer protection, e.g. lead content in toys
• Analysis of alloys with highest requirements of accuracy in the jewellery and watch industries and in metal refineries
• Research in universities and in the industries

• These are available in two different range including XAN 250 and XAN 252.
• These are user friendly devices acclaimed for compact size and consistent performance.
• Our devices are acclaimed for their quick and easy sample positioning and consistent performance.
• These are fitted with the X-ray source and semiconductor detector which are further located in the instrument‘s lower chamber.
• Engineered under the firm direction of experienced quality controllers, these are fitted with the integrated video-microscope with zoom and crosshairs simplifies sample placement which further allows precise measuring spot adjustment and ensure clear presentation of measurement data on a PC with the help of powerful and user-friendly WinFTM® software.
• These are designed and developed in accordance with German regulations "Deutsche Rontgenverordnung-rov".

Intended use

Energy dispersive x-ray fluorescence measuring instrument (EDXRF) to determine thin coatings, Gold Testing, Gold analysis, trace elements and alloys

Element range

Aluminium (13) to Uranium (92) up to 24 elements simultaneously

Design

Bench top unit with upwards opening hood

Measuring direction

Bottom up

X-ray tube

Micro-focus tungsten tube with beryllium window

Aperture (Collimator)

4x changeable: 0.2 mm (7.9 mils), 0.6 mm (23.6 mils), 1 mm (39.4 mils), 2 mm (78.7 mils), others on request

Primary filter

6x changeable: Ni, free, Al 1000 m (39.4 mils); Al 500 m (19.7 mils); Al 100 m (3.9 mils); Mylar 100 m (3.9mils)

Measurement spot

Depending on the measuring distance and on the aperture, the actual measurement spot size is shown in the video image. Smallest measurement spot: approx. 0.3 mm (11.8 mils)

X-ray detector

Silicon Drift Detector (SDD), peltier-cooled Resolution (fwhm for Mn-K±) 160 eV

Measuring distance

0....10 mm (0...0.4 in)  Distance compensation with patented DCM method for simplified measurements at varying distances. For particular applications or for higher demands on accuracy an additional calibration might be necessary.

Design

Fixed sample support

Usable sample placement area

310 x 320 mm (12.2 x 12.6 in)

Max. sample weight

13 kg (29 lb)

Max. sample height

90 mm (3.5 in)

External dimensions Width x depth x height

403 x 588 x 365 mm (16 x 23.2 x 14.4 in)

Weight Approx.

45 kg (99 lb)